Computational Investigation of Microwave Breakdown in HPM Switching and Protection

Abstract

The 2D simulations of HPM breakdown induced plasma formation in the context of applications such as HPM switching and power limiter for protection of electronic components presented. Breakdown thresholds, the field strength and the initial plasma density that determines breakdown time are reported. The dependence of cutoff time on initial plasma as well as strength of microwave E-field are reported. The transmission and rejection capability of plasma for certain frequency is shown. Further, variations in permittivity and conductivity of breakdown plasma also studied. Study also highlights the importance of correct choice of diffusion coefficient in the given fluid-based model.