{"title":"Three new strip-line TEM cells in EMC test","authors":"Luo Wen, Guan Yalin, Li Jin","doi":"10.1109/ICEICT.2016.7879750","DOIUrl":null,"url":null,"abstract":"The strip-line TEM cell is used to measure the EMC of equipment and devices. Strip-line TEM cell can be widely used in measuring the EMC (Electromagnetic Compatibility) performance from automotive industry to IC components. In this paper we present three different strip-line TEM cells. And cut slot on conductor can extend the frequency range of strip-line TEM cell. The cost is lower, the operation is easier, and the cell is more applicability with this method.","PeriodicalId":224387,"journal":{"name":"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Electronic Information and Communication Technology (ICEICT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEICT.2016.7879750","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The strip-line TEM cell is used to measure the EMC of equipment and devices. Strip-line TEM cell can be widely used in measuring the EMC (Electromagnetic Compatibility) performance from automotive industry to IC components. In this paper we present three different strip-line TEM cells. And cut slot on conductor can extend the frequency range of strip-line TEM cell. The cost is lower, the operation is easier, and the cell is more applicability with this method.