Evaluation of gassing materials in switching devices using monochromatic high speed imaging technique

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI:10.1109/HOLM.2001.953201

Xin Zhou

{"title":"Evaluation of gassing materials in switching devices using monochromatic high speed imaging technique","authors":"Xin Zhou","doi":"10.1109/HOLM.2001.953201","DOIUrl":null,"url":null,"abstract":"The purpose of this paper is to investigate quantitative information on prospective gassing materials to be used in switching devices. Previous work indicates that gassing materials have a strong effect on current interruption and current limiting in these devices. However, few papers have been published to cover quantitative information on the amount of certain gassing species released, such as hydrogen, when the gassing material is exposed to a running arc. Monochromatic high speed imaging techniques were employed in this investigation to characterize hydrogen gassing properties of different materials based on hydrogen arc images and nitrogen arc images, respectively. Hydrogen plasma has a very high thermal conductivity that results in high arc voltages during interruption, which is critical to current limiting. Comparison among prospective gassing materials was made. The mass loss results derived from plasma emission intensities showed good agreement with direct mass loss measurements of gassing materials.","PeriodicalId":136044,"journal":{"name":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2001.953201","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 14

Abstract

The purpose of this paper is to investigate quantitative information on prospective gassing materials to be used in switching devices. Previous work indicates that gassing materials have a strong effect on current interruption and current limiting in these devices. However, few papers have been published to cover quantitative information on the amount of certain gassing species released, such as hydrogen, when the gassing material is exposed to a running arc. Monochromatic high speed imaging techniques were employed in this investigation to characterize hydrogen gassing properties of different materials based on hydrogen arc images and nitrogen arc images, respectively. Hydrogen plasma has a very high thermal conductivity that results in high arc voltages during interruption, which is critical to current limiting. Comparison among prospective gassing materials was made. The mass loss results derived from plasma emission intensities showed good agreement with direct mass loss measurements of gassing materials.

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用单色高速成像技术评价开关器件中的气体材料

本文的目的是研究用于开关器件的潜在气体材料的定量信息。以往的工作表明，在这些器件中，气体材料对电流中断和电流限制有很强的影响。然而，很少有论文涵盖了当气体材料暴露在电弧中时释放的某些气体种类(如氢气)的数量的定量信息。本文采用单色高速成像技术，分别基于氢弧图像和氮弧图像对不同材料的氢气特性进行表征。氢等离子体具有非常高的导热性，导致中断时电弧电压高，这对电流限制至关重要。对几种有前景的气体材料进行了比较。由等离子体发射强度得到的质量损失结果与气体材料的直接质量损失测量结果一致。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)

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