Physical Properties of Copper Oxide Thin Films Prepared by Sol–Gel Spin–Coating Method

M. Dhaouadi, M. Jlassi, I. Sta, I. B. Miled, G. Mousdis, M. Kompitsas, W. Dimassi
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引用次数: 42

Abstract

In this study, copper oxide thin films prepared by the sol–gel method, have been deposed onto glass substrates by the spin coating technique. Our target was to study their properties and improve them for photovoltaic use. These properties were optimized by varying the temperature annealing and the molar concentration of the precursor solutions. The effects of the annealing temperature on the structural and optical properties of the thin films are studied. It was found that the film treated at 550°C shows a higher absorbance. Then by using this optimized temperature, CuO thin films of various molar concentrations, were deposited at the same experimental conditions. The structural analysis by X- ray diffraction (XRD) shows that all the samples are polycrystalline with monoclinic crystal structure. Raman scattering measurements of all thin films confirms the structure of CuO. The optical properties of the films were characterized by UV–Visible–NIR spectrophotometry, which shows that the films show high absorbance in the visible region. Their optical band gap decreases from 3.68 to 2.44 eV when the molar concentration of precursor solutions increases from 0.1 to 0.5 M. The electrical measurements show that the resistivity of the films varies slightly from 84 Ω cm to 124 Ω cm as the molar concentration increases.
溶胶-凝胶旋涂法制备氧化铜薄膜的物理性能
本研究利用自旋镀膜技术,将溶胶-凝胶法制备的氧化铜薄膜沉积在玻璃基板上。我们的目标是研究它们的性能并改进它们用于光伏发电。通过改变退火温度和前驱体溶液的摩尔浓度来优化这些性能。研究了退火温度对薄膜结构和光学性能的影响。结果表明,在550℃下处理的膜具有较高的吸光度。然后在此优化温度下,在相同的实验条件下沉积不同摩尔浓度的CuO薄膜。X射线衍射(XRD)分析表明,样品均为单斜晶结构的多晶。所有薄膜的拉曼散射测量证实了CuO的结构。用紫外-可见-近红外分光光度法对膜的光学性能进行了表征,结果表明膜在可见光区具有较高的吸光度。当前驱体溶液的摩尔浓度从0.1 m增加到0.5 m时,薄膜的光学带隙从3.68 eV减小到2.44 eV。电学测量表明,随着摩尔浓度的增加,薄膜的电阻率在84 Ω cm到124 Ω cm之间变化不大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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