Measurement method of light transmittance of layered metal-dielectric metamaterial

Abstract

We propose a measurement method of light transmittance of metamaterials by directly contacting the metamaterial on a Si photodiode. Our measurement method enables direct detection of not only the propagation wave component but also the evanescent wave component through the metamaterial. In this paper, we fabricated a layered metal-dielectric metamaterial composed of Ag/Al2O3 layers on the Si photodiode. The transmittance property of evanescent wave was measured. This result indicates that our measurement system detects evanescent wave transferred through the fabricated metamaterial.