L. Tan, R. Cobian, B. Stadler, L. Wang, C. Leighton, P. Crowell
{"title":"Electrodeposition of Co/Cu Multilayered Nanowires with Controlled Crystallographic Orientation","authors":"L. Tan, R. Cobian, B. Stadler, L. Wang, C. Leighton, P. Crowell","doi":"10.1109/INTMAG.2006.374905","DOIUrl":null,"url":null,"abstract":"In this work, Co/Cu multilayered nanowires with different crystallographic orientations were deposited by template-assisted electrochemical deposition into alumina nanopore arrays. Results showed that by applying magnetic fields during the deposition, the crystallographic texture of Co layers could be effectively influenced. The giant magnetoresistance (GMR) effect decreased with decreasing Cu thicknesses as was expected but which is different from multilayered-film systems. Actually, when the Cu layer thickness decreased to about lnm, anisotropic magnetoresistance (AMR) was observed instead of GMR.","PeriodicalId":262607,"journal":{"name":"INTERMAG 2006 - IEEE International Magnetics Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"INTERMAG 2006 - IEEE International Magnetics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTMAG.2006.374905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this work, Co/Cu multilayered nanowires with different crystallographic orientations were deposited by template-assisted electrochemical deposition into alumina nanopore arrays. Results showed that by applying magnetic fields during the deposition, the crystallographic texture of Co layers could be effectively influenced. The giant magnetoresistance (GMR) effect decreased with decreasing Cu thicknesses as was expected but which is different from multilayered-film systems. Actually, when the Cu layer thickness decreased to about lnm, anisotropic magnetoresistance (AMR) was observed instead of GMR.