A novel experimental approach to calibrating cohesive zone elements for advanced risk analysis of interface delamination in semiconductor packages

G. M. Reuther, N. Pflügler, Dominik Udiljak, R. Pufall, B. Wunderle
{"title":"A novel experimental approach to calibrating cohesive zone elements for advanced risk analysis of interface delamination in semiconductor packages","authors":"G. M. Reuther, N. Pflügler, Dominik Udiljak, R. Pufall, B. Wunderle","doi":"10.23919/EMPC.2017.8346877","DOIUrl":null,"url":null,"abstract":"Interface delamination in moulded semiconductor packages, being caused by thermo-mechanical load, constitutes a major reliability risk. Delaminated units that are exposed to humidity in automotive environments are prone to moisture absorption via opened interfaces. This increases the risk of metal corrosion, which eventually leads to product failure. In order to identify the failure mechanisms behind delamination, Finite Element Modelling (FEM) based on Cohesive Zone Modelling is an indispensable tool. FEM allows one to assess the robustness of interfaces in moulded packages, e.g. between moulding compound and lead frame. On the contrary, conducting standalone stress tests is not sufficient to identify the root cause of the observed failure mode. Selecting appropriate parameters for the cohesive zone elements is a demanding task, because the set of parameters has significant effect on the failure mechanism that one observes in FE simulation. Experiments that are normally used to quantify adhesion can support calibration of cohesive elements in order to accurately predict potential reliability risks. In this article we present a novel idea that enables determining the interface stiffness and critical fracture energy in shear mode by means of the Advanced Button Shear Test Setup. To this end we sheared buttons of moulding compound off a lead frame stripe. Starting from load-displacement curves we determine the temperature dependence of measured shear forces at crack opening and calculated critical fracture energies. The respective quantities for tensile mode are then derived using phenomenological models. As a result, we obtain all parameters that are required to calibrate cohesive zone element models for FEM.","PeriodicalId":329807,"journal":{"name":"2017 21st European Microelectronics and Packaging Conference (EMPC) & Exhibition","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 21st European Microelectronics and Packaging Conference (EMPC) & Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EMPC.2017.8346877","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

Interface delamination in moulded semiconductor packages, being caused by thermo-mechanical load, constitutes a major reliability risk. Delaminated units that are exposed to humidity in automotive environments are prone to moisture absorption via opened interfaces. This increases the risk of metal corrosion, which eventually leads to product failure. In order to identify the failure mechanisms behind delamination, Finite Element Modelling (FEM) based on Cohesive Zone Modelling is an indispensable tool. FEM allows one to assess the robustness of interfaces in moulded packages, e.g. between moulding compound and lead frame. On the contrary, conducting standalone stress tests is not sufficient to identify the root cause of the observed failure mode. Selecting appropriate parameters for the cohesive zone elements is a demanding task, because the set of parameters has significant effect on the failure mechanism that one observes in FE simulation. Experiments that are normally used to quantify adhesion can support calibration of cohesive elements in order to accurately predict potential reliability risks. In this article we present a novel idea that enables determining the interface stiffness and critical fracture energy in shear mode by means of the Advanced Button Shear Test Setup. To this end we sheared buttons of moulding compound off a lead frame stripe. Starting from load-displacement curves we determine the temperature dependence of measured shear forces at crack opening and calculated critical fracture energies. The respective quantities for tensile mode are then derived using phenomenological models. As a result, we obtain all parameters that are required to calibrate cohesive zone element models for FEM.
一种新的实验方法来校准半导体封装中界面分层的高级风险分析的内聚区元素
模制半导体封装中的界面分层是由热机械负载引起的,构成了主要的可靠性风险。暴露在潮湿的汽车环境中的分层单元容易通过打开的接口吸收水分。这增加了金属腐蚀的风险,最终导致产品失效。为了识别分层破坏机制,基于黏聚区模型的有限元建模是必不可少的工具。FEM允许评估模压封装中接口的稳健性,例如在模压化合物和引线框架之间。相反,进行独立的压力测试不足以确定观察到的失效模式的根本原因。选取合适的参数是一项艰巨的任务,因为参数集对有限元模拟中观察到的破坏机制有重要影响。通常用于定量黏附的实验可以支持黏附元件的校准,从而准确预测潜在的可靠性风险。在本文中,我们提出了一种新颖的想法,可以确定界面刚度和临界断裂能在剪切模式下,通过先进的按钮剪切试验装置。为此,我们剪了按钮的模塑化合物从引线框架条纹。从荷载-位移曲线出发,确定了裂缝张开处实测剪力与温度的关系,并计算了临界断裂能。然后使用现象学模型推导出拉伸模态的相应量。从而得到了有限元法内聚区单元模型标定所需的所有参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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