Numerical simulation of InAs nBn infrared detectors with n-type barrier layers

M. Reine, B. Pinkie, J. Schuster, E. Bellotti
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引用次数: 5

Abstract

This paper presents one-dimensional numerical simulations and analytical modeling of ideal (only diffusion current and only Auger-1 and radiative recombination) InAs nBn detectors having n-type barrier layers, with donor concentrations ranging from 1.8×1015 to 2.5×1016 cm-3. We examine quantitatively the three space charge regions in the nBn detector with an n-type barrier layer (BL), and determine criteria for combinations of bias voltage and BL donor concentration that allow operation of the nBn with no depletion region in the narrow-gap absorber layer (AL) or contact layer (CL). We determine the quantitative characteristics of the valence band barrier that is present for an n-type BL. From solution of Poisson’s equation in the uniformly doped BL, we derive analytical expressions for the valence band barrier heights versus bias voltage for holes in both the AL and the CL. These expressions show that the VB barrier height varies linearly with the BL donor concentration and as the square of the BL width. Using these expressions, we constructed a phenomenological equation for the dark current density versus bias voltage which agrees reasonably well with the shape of the J(V) curves from numerical simulations. Our simulations suggest that the nBn detector should be able to be operated at or near zero-bias voltage.
具有n型势垒层的InAs nBn红外探测器的数值模拟
本文介绍了具有n型势垒层的理想(仅扩散电流、仅俄歇-1和辐射复合)InAs nBn探测器的一维数值模拟和分析模型,其施主浓度范围为1.8×1015至2.5×1016 cm-3。我们定量地研究了具有n型势垒层(BL)的nBn探测器中的三个空间电荷区,并确定了偏置电压和BL供体浓度组合的标准,使nBn在窄间隙吸收层(AL)或接触层(CL)中没有耗尽区。我们确定了n型BL中存在的价带势垒的定量特征。根据均匀掺杂BL中泊松方程的解,我们得到了AL和CL中空穴的价带势垒高度与偏置电压的解析表达式。这些表达式表明,VB势垒高度与BL供体浓度和BL宽度的平方成线性关系。利用这些表达式,我们建立了暗电流密度与偏置电压的现象学方程,该方程与数值模拟的J(V)曲线的形状相当吻合。我们的模拟表明,nBn探测器应该能够在零偏置电压或接近零偏置电压下工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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