Specialized Hardware and Software for The Study of Thermoelectric Properties of Semiconductors

Abstract

The methods of investigation of thermoelectric parameters of semiconductors, which are optimal for the implementation of software and hardware, are analyzed and selected. The Harman method and its modifications are taken as a basis. The required operating ranges, memory and performance resources have been identified, and a structural and electrical diagram has been developed, as well as software of a specialized computer system for the study of thermoelectric parameters of both massive and thin-film thermoelectric materials. A rapid analysis of the operational characteristics of the finished module has been designed.