Effect Of The Etching Regimes On The Memristor Properties Of Al2O3 Thin Layers

N. Rybina, N. Rybin
{"title":"Effect Of The Etching Regimes On The Memristor Properties Of Al2O3 Thin Layers","authors":"N. Rybina, N. Rybin","doi":"10.1109/RADIOELEKTRONIKA49387.2020.9092408","DOIUrl":null,"url":null,"abstract":"The switching effect in the Au-Ta-Al<inf>2</inf>O<inf>3</inf>-Cr structure was revealed. The memristor properties with bipolar switching were revealed at switching voltages U<inf>set</inf> = 5.2 V and U<inf>reset</inf> = -3.5 V. The ratio of high resistance and low resistance states was 7.10<sup>5</sup> Ohms. Effect of the etching regimes on the memristor properties of Al<inf>2</inf>O<inf>3</inf> thin layers was studied. It was revealed that the best way to remove aluminum oxide is to etch the structures in a 20% HF solution without contact protection.","PeriodicalId":131117,"journal":{"name":"2020 30th International Conference Radioelektronika (RADIOELEKTRONIKA)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 30th International Conference Radioelektronika (RADIOELEKTRONIKA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADIOELEKTRONIKA49387.2020.9092408","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The switching effect in the Au-Ta-Al2O3-Cr structure was revealed. The memristor properties with bipolar switching were revealed at switching voltages Uset = 5.2 V and Ureset = -3.5 V. The ratio of high resistance and low resistance states was 7.105 Ohms. Effect of the etching regimes on the memristor properties of Al2O3 thin layers was studied. It was revealed that the best way to remove aluminum oxide is to etch the structures in a 20% HF solution without contact protection.
蚀刻方式对Al2O3薄层忆阻器性能的影响
揭示了Au-Ta-Al2O3-Cr结构中的开关效应。研究了开关电压Uset = 5.2 V和Ureset = -3.5 V时双极开关的忆阻器特性。高阻状态与低阻状态之比为7.105欧姆。研究了蚀刻工艺对氧化铝薄层忆阻器性能的影响。结果表明,去除氧化铝的最佳方法是在不带接触保护的20% HF溶液中进行蚀刻。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信