A comprehensive system of measuring anisotropic dielectric properties of rock samples

Abstract

An efficient dielectric property measurement system is introduced in this paper. In the proposed measurement system, a parallel-disk sample holder with a new designed substrate is employed, which enables measuring the anisotropic input impedance of rock samples by rotating testing samples inside the holder. Moreover, a full wave simulation method is utilized to numerically calculate anisotropic input impedances of rock samples using anisotropic permittivity and conductivity given in a wide range. Anisotropic dielectric properties of a rock sample can then be estimated by comparing and correlating its experimental results and pre-computed simulation results. Additional look-up tables can be numerically computed for different substrate materials. Based on measured anisotropic input impedance and known material property of the substrate, dielectric properties of a certain rock sample can be computed from the corresponding look-up table.