Stathis Maneas, K. Mahdaviani, Tim Emami, Bianca Schroeder
{"title":"Reliability of SSDs in Enterprise Storage Systems","authors":"Stathis Maneas, K. Mahdaviani, Tim Emami, Bianca Schroeder","doi":"10.1145/3423088","DOIUrl":null,"url":null,"abstract":"This article presents the first large-scale field study of NAND-based SSDs in enterprise storage systems (in contrast to drives in distributed data center storage systems). The study is based on a very comprehensive set of field data, covering 1.6 million SSDs of a major storage vendor (NetApp). The drives comprise three different manufacturers, 18 different models, 12 different capacities, and all major flash technologies (SLC, cMLC, eMLC, 3D-TLC). The data allows us to study a large number of factors that were not studied in prior works, including the effect of firmware versions, the reliability of TLC NAND, and the correlations between drives within a RAID system. This article presents our analysis, along with a number of practical implications derived from it.","PeriodicalId":273014,"journal":{"name":"ACM Transactions on Storage (TOS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Transactions on Storage (TOS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3423088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This article presents the first large-scale field study of NAND-based SSDs in enterprise storage systems (in contrast to drives in distributed data center storage systems). The study is based on a very comprehensive set of field data, covering 1.6 million SSDs of a major storage vendor (NetApp). The drives comprise three different manufacturers, 18 different models, 12 different capacities, and all major flash technologies (SLC, cMLC, eMLC, 3D-TLC). The data allows us to study a large number of factors that were not studied in prior works, including the effect of firmware versions, the reliability of TLC NAND, and the correlations between drives within a RAID system. This article presents our analysis, along with a number of practical implications derived from it.