Influence Of Duty Cycle On Pulse Modulated Rf Capacitively-Coupled Argon Discharge

Lijie Chang, Xinpei Lu, Shali Yang, Xiang-mei Liu, Wei Jiang
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Abstract

Pulsed rf capactively-coupled discharge has attracted a lot of attention recently due to its widely applications in industrial film processes. In order to further optimize the plasma properties, a Particle-in-Cell simulation with Monte Carlo collisions was developed to explore the influence of pulsemodulated duty cycle on the sustaining of discharge and the fundamental plasma characteristics in the afterglow of pulse modulated RF capactively-coupled argon discharge at high pressure (0.3–1 Torr). It is found that, compared with the continuous wave rf plasma, the pulsed-modulated rf discharge can be sustained at a more broad driving frequency range, moreover, it can achieve higher electron density with lower electron energy for low driving frequency. At the pressure of 0.3 Torr, the electron density first decreases and then increases with the increasing duty ratio, with critical point around 2.5 MHz, while the electron temperature is inverse to that behavior. At the pressure of 1 Torr, the electron density shows the same pattern, with critical point around 6 MHz, while the electron temperature is always lower for the lower duty cycle.
占空比对脉冲调制射频电容耦合氩放电的影响
脉冲射频电容耦合放电由于在工业薄膜工艺中的广泛应用,近年来引起了人们的广泛关注。为了进一步优化等离子体的性能,采用Monte Carlo碰撞模拟方法,研究了脉冲调制占空比对高压(0.3-1 Torr)脉冲调制射频电容耦合氩放电余烬中等离子体的基本特性和放电持续时间的影响。研究发现,与连续波射频等离子体相比,脉冲调制射频放电可以在更宽的驱动频率范围内持续,并且在低驱动频率下可以以更低的电子能量获得更高的电子密度。在0.3 Torr压力下,随着占空比的增加,电子密度先减小后增大,临界点在2.5 MHz左右,而电子温度与此相反。在1 Torr压力下,电子密度表现出相同的规律,临界点在6 MHz左右,而电子温度在较低的占空比下始终较低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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