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On-Chip NBTI and PBTI Tracking through an All-Digital Aging Monitor Architecture

International Workshop on Power and Timing Modeling, Optimization and Simulation Pub Date : 2012-09-04 DOI:10.1007/978-3-642-36157-9_16
H. K. Alidash, A. Calimera, A. Macii, E. Macii, M. Poncino
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引用次数: 8
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基于全数字老化监测体系结构的片上NBTI和PBTI跟踪
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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International Workshop on Power and Timing Modeling, Optimization and Simulation
International Workshop on Power and Timing Modeling, Optimization and Simulation
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