MicroVault: Reliable Storage Unit for IoT Devices

Emekcan Aras, M. Ammar, Fan Yang, W. Joosen, D. Hughes
{"title":"MicroVault: Reliable Storage Unit for IoT Devices","authors":"Emekcan Aras, M. Ammar, Fan Yang, W. Joosen, D. Hughes","doi":"10.1109/DCOSS49796.2020.00031","DOIUrl":null,"url":null,"abstract":"The Internet of Things (IoT) is being deployed at large scale in a wide range of long-life applications. Examples range from Industry 4.0 to smart lighting systems. These applications have diverse requirements of non-volatile storage. However, the flash memory that is used in today’s IoT devices offers limited write endurance and must therefore be carefully managed if applications are to deliver on their promises of multiyear lifetimes. Managing the health of flash memory is difficult for application developers, as it requires in-depth hardware and software knowledge, which often needs to the problem being neglected. While various techniques have been proposed to preserve the health of flash memory, prior work tends to focus on a single hardware platform and data type. Furthermore, prior work does not provide lifetime guarantees. This paper tackles this problem by proposing MicroVault, a simple and unified interface for reliable non-volatile data storage on resource-constrained IoT devices. MicroVault enforces developer-specified lifetime guarantees through a range of lifetime extension techniques, which are adaptively applied based upon the needs of the application. Evaluation shows that MicroVault dramatically extends the lifetime of flash memory while minimising overhead.","PeriodicalId":198837,"journal":{"name":"2020 16th International Conference on Distributed Computing in Sensor Systems (DCOSS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 16th International Conference on Distributed Computing in Sensor Systems (DCOSS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DCOSS49796.2020.00031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

The Internet of Things (IoT) is being deployed at large scale in a wide range of long-life applications. Examples range from Industry 4.0 to smart lighting systems. These applications have diverse requirements of non-volatile storage. However, the flash memory that is used in today’s IoT devices offers limited write endurance and must therefore be carefully managed if applications are to deliver on their promises of multiyear lifetimes. Managing the health of flash memory is difficult for application developers, as it requires in-depth hardware and software knowledge, which often needs to the problem being neglected. While various techniques have been proposed to preserve the health of flash memory, prior work tends to focus on a single hardware platform and data type. Furthermore, prior work does not provide lifetime guarantees. This paper tackles this problem by proposing MicroVault, a simple and unified interface for reliable non-volatile data storage on resource-constrained IoT devices. MicroVault enforces developer-specified lifetime guarantees through a range of lifetime extension techniques, which are adaptively applied based upon the needs of the application. Evaluation shows that MicroVault dramatically extends the lifetime of flash memory while minimising overhead.
MicroVault:物联网设备的可靠存储单元
物联网(IoT)正在广泛的长寿命应用中大规模部署。例如从工业4.0到智能照明系统。这些应用程序对非易失性存储有不同的要求。然而,当今物联网设备中使用的闪存提供有限的写入持久性,因此如果应用程序要实现其多年使用寿命的承诺,则必须仔细管理。对于应用程序开发人员来说,管理闪存的健康状况是很困难的,因为它需要深入的硬件和软件知识,而这往往需要解决被忽视的问题。虽然已经提出了各种技术来保持闪存的健康,但先前的工作往往侧重于单一硬件平台和数据类型。此外,先前的工作并不能提供终身保证。本文通过提出MicroVault解决了这个问题,MicroVault是一个简单而统一的接口,用于在资源受限的物联网设备上可靠的非易失性数据存储。MicroVault通过一系列生命周期扩展技术强制执行开发人员指定的生命周期保证,这些技术可根据应用程序的需要自适应地应用。评估表明,MicroVault显著延长了闪存的使用寿命,同时最大限度地减少了开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信