Stability testing of CdTe/CdS thin-film photovoltaic modules

R. Powell, R. Sasala, G. Rich, M. Steele, K. Bihn, N. Reiter, S. Cox, G. Dorer
{"title":"Stability testing of CdTe/CdS thin-film photovoltaic modules","authors":"R. Powell, R. Sasala, G. Rich, M. Steele, K. Bihn, N. Reiter, S. Cox, G. Dorer","doi":"10.1109/PVSC.1996.564245","DOIUrl":null,"url":null,"abstract":"High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols do not adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced.","PeriodicalId":410394,"journal":{"name":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1996.564245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20

Abstract

High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols do not adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced.
CdTe/CdS薄膜光伏组件稳定性测试
高效率、耐用性和长期稳定性是高性价比光伏组件的关键组成部分。ASTM E948, E1036和模块资格测试等行业建立的测试效率和耐久性协议有效地确保了初始模块性能以及封装和机械部件的完整性。然而,这些协议不能充分测试模块的长期性能。本文描述了利用各种应用应力的加速测试方法的初步发展。2年多的室内测试结果表明,可以生产出稳定的cd /CdTe模块。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信