Two-dimensional simulation of kink-related backgating effect in GaAs MESFETs

Abstract

2-D simulation of backgating effect in GaAs MESFETs is made in which impact ionization of carriers and deep donors "EL2" in the substrate are considered. The kink-related backgating is reproduced, which is qualitatively consistent with recent experiments. The mechanism is attributed to the change of EL2's nature by capturing holes which are generated by impact ionization and flow into the substrate.