CICADA: A New Tool to Design Circuits with Correction and Detection Abilities

A. Stempkovsky, T. ZHukova, D. V. Telpukhov, S. Gurov
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Abstract

In view of rapid development of microelectronic industry, there is a growing need to ensure reliability and fault tolerance of combinational devices exposed to various destabilizing effects. To solve this problem, methods based on synthesis of concurrent error detection (CED) circuits are now increasingly used, which enable, at the expense of some structural redundancy, correcting and/or detecting errors arising in the circuit. For each specific circuit, depending on the chosen synthesis method, CED circuits have different reliability characteristics, which makes it difficult for designers to choose one or another architecture. Therefore, there is a need to increase automation level of the process of selecting a method for control circuit synthesis, depending on the initial parameters of the protected device. This work is devoted to development of methods and software for detecting the best method for synthesizing a control circuit, taking into account the user-introduced constraint on structural redundancy of the resulting circuit.
CICADA:一种具有校正和检测能力的电路设计新工具
随着微电子工业的快速发展,对受各种不稳定因素影响的组合器件的可靠性和容错性的要求越来越高。为了解决这个问题,基于并发错误检测(CED)电路的综合方法现在越来越多地使用,它能够以一些结构冗余为代价,纠正和/或检测电路中产生的错误。对于每个特定的电路,根据所选择的合成方法,CED电路具有不同的可靠性特性,这使得设计人员难以选择一种或另一种架构。因此,有必要根据被保护装置的初始参数,提高选择控制电路合成方法的过程的自动化水平。这项工作致力于开发方法和软件,以检测合成控制电路的最佳方法,同时考虑到用户引入的对所得到电路的结构冗余的约束。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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