Failure of digital IC under the influence of electromagnetic radiation

11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487) Pub Date : 2001-09-10 DOI:10.1109/CRMICO.2001.961662

K.B. Vasiliev, A. Klyuchnik, A. V. Solodov

引用次数: 0

Abstract

The experimental data of digital IC failure under the influence of short pulse electromagnetic irradiation are presented. The energy of IC damage is determined as a function of electromagnetic pulse duration and repetition rate. Experiments have been performed in centimeter and millimeter wave band.

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数字集成电路在电磁辐射影响下的失效

给出了短脉冲电磁辐射下数字集成电路失效的实验数据。集成电路损伤能量是电磁脉冲持续时间和重复频率的函数。在厘米波段和毫米波波段进行了实验。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)

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