An On-line Reliability Emulation Framework

Pietro Mercati, Andrea Bartolini, Francesco Paterna, L. Benini, T. Simunic
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引用次数: 7

Abstract

Technology scaling made reliability a primary concern for integrated circuits. Increased power and temperature exasperate the impact of degradation phenomena and shorten processors lifetime. This issue is particularly dramatic for mobile processors, characterized by variable workload and environmental conditions. Due to the different time scales at which reliability phenomena and computation happens, state-of-theartDRM solutions are evaluated using high-level workload and system models. To enable the design of workload-aware DRM with accurate reliability models, in this work we propose a software framework for virtualizing the processors reliability.Our framework captures the effect of variable workload and environmental conditions and allows to emulate longer degradation in a short time scale. We implement the framework on a realAndroid device and exploit it to enable workload-aware DynamicReliability Management (DRM).
一个在线可靠性仿真框架
技术的规模化使得可靠性成为集成电路的首要问题。增加的功率和温度加剧了退化现象的影响,缩短了处理器的使用寿命。这个问题对于具有可变工作负载和环境条件的移动处理器来说尤其严重。由于可靠性现象和计算发生的时间尺度不同,因此使用高级工作负载和系统模型来评估最新的drm解决方案。为了设计具有准确可靠性模型的工作负载感知DRM,本文提出了一个虚拟化处理器可靠性的软件框架。我们的框架捕捉了可变工作负载和环境条件的影响,并允许在短时间内模拟更长时间的退化。我们在一个真正的android设备上实现了这个框架,并利用它来实现工作负载感知的动态可靠性管理(DRM)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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