Using FSV with far-field patterns

Abstract

Feature Selection Validation has now become an IEEE Standard, and is gaining popularity in the Computational Electromagnetic Community. As with any new approach it presents new and unique challenges to the user. This paper explores the use of Feature Selection Validation for evaluating far-field patterns in several examples and discusses some practical limitation discovered. One important conclusion that must be drawn is that context remains the most important aspect of evaluating results with the Feature Selection Validation process.