{"title":"ICEM: a new standard for EMC of IC definition and examples","authors":"C. Lochot, J. Levant","doi":"10.1109/ISEMC.2003.1236727","DOIUrl":null,"url":null,"abstract":"The ICEM standard (Integrated Circuit Electromagnetic Model) was proposed by the French standard committee (UTE) where many semi-conductor manufacturers and final users are involved. The ICEM standard proposal is nowadays registered as a Technical Report (IEC62014-3). In the first part of this paper, the authors will present the architecture of the model. In the second part, they will describe different methods to characterize the parameters of the model. Finally, comparisons between measurement and simulation results highlight the capability of this approach for the prediction of the electromagnetic emission of an IC.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236727","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 29
Abstract
The ICEM standard (Integrated Circuit Electromagnetic Model) was proposed by the French standard committee (UTE) where many semi-conductor manufacturers and final users are involved. The ICEM standard proposal is nowadays registered as a Technical Report (IEC62014-3). In the first part of this paper, the authors will present the architecture of the model. In the second part, they will describe different methods to characterize the parameters of the model. Finally, comparisons between measurement and simulation results highlight the capability of this approach for the prediction of the electromagnetic emission of an IC.