Shunfeng Cheng, N. Raghavan, Jie Gu, S. Mathew, M. Pecht
{"title":"Physics-of-Failure Approach to PHM","authors":"Shunfeng Cheng, N. Raghavan, Jie Gu, S. Mathew, M. Pecht","doi":"10.1002/9781119515326.CH3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":163377,"journal":{"name":"Prognostics and Health Management of Electronics","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Prognostics and Health Management of Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/9781119515326.CH3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}