Analysis of software process improvement experience using the project visibility index

Keishi Sakamoto, Naoki Niihara, Toshifumi Tanaka, K. Nakakoji, K. Kishida
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引用次数: 5

Abstract

Based on the capability maturity model (CMM), process improvement at OMRON, a Japanese microprocessor manufacturer, increased project predictability in three ways: accuracy, variability, and performance. The authors use the project visibility index (PVI) and other measurements to quantitatively demonstrate this. Qualitative analysis of how and why OMRON achieved higher project visibility and increases in the QCD (quality, cost, and delivery on time) factors are supported with data on review-effort ratios and productivity. They identify factors directly affected by high project visibility.
使用项目可见性指数分析软件过程改进经验
基于能力成熟度模型(CMM),日本微处理器制造商OMRON的过程改进以三种方式增加了项目的可预测性:准确性、可变性和性能。作者使用项目可见性指数(PVI)和其他度量来定量地证明这一点。对欧姆龙如何以及为什么获得更高的项目可见性并增加QCD(质量、成本和按时交付)因素的定性分析得到了评审工作比和生产率数据的支持。他们识别直接受高项目可见性影响的因素。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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