Effects of mode conversion on parasitic coupling in high-speed VLSI circuits

Proceedings. 8th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2004-05-09 DOI:10.1109/SPI.2004.1409050

Y. Quéré, T. Le Gouguec, P. Martin, D. Le Berre, F. Huret

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引用次数: 2

Abstract

The mode conversion means that a modification of the electromagnetic field configuration occurs, generally, after discontinuities. In deep submicron digital ULSI circuits, the mode conversion analysis is indispensable to identify the signal return path, the return current distribution and therefore, for an accurate inductance modelling which remains a challenging problem (Y. I. Ismael and E. G. Friedman, 2000). On the other hand, switching activity of high speed CMOS circuit may produce large current derivatives in wires (crosstalk) and substrate. These current transients can generate large potential surges and coupled noise. In this mind, a reduction of the mode conversion phenomenon decreases noise in high speed ULSI circuits (Y. Quere et al., 2003). We have investigated the mode conversion, in the frequency domain, for multiple-line inter-layer transitions in CMOS devices. The signal integrity analysis in time domain proved the detrimental effects of mode conversion. Finally, we confirmed that our design rule reduces the mode conversion phenomenon in the case of transition with multiple coupled lines.

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高速VLSI电路中模式转换对寄生耦合的影响

模式转换通常是指在不连续之后发生电磁场结构的改变。在深亚微米数字ULSI电路中，模式转换分析对于识别信号返回路径，返回电流分布以及因此精确的电感建模是必不可少的，这仍然是一个具有挑战性的问题(Y. I. Ismael和E. G. Friedman, 2000)。另一方面，高速CMOS电路的开关活动可能会在导线(串扰)和衬底中产生较大的电流导数。这些电流瞬态会产生较大的电位浪涌和耦合噪声。在这种思想中，减少模式转换现象可以降低高速ULSI电路中的噪声(Y. Quere等人，2003)。我们研究了CMOS器件中多线层间跃迁的频域模式转换。时域信号完整性分析证明了模式转换的不利影响。最后，我们证实了我们的设计规则减少了多耦合线过渡情况下的模式转换现象。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings. 8th IEEE Workshop on Signal Propagation on Interconnects

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