Robust 3.3kV silicon carbide MOSFETs with surge and short circuit capability

L. Knoll, A. Mihaila, F. Bauer, V. Sundaramoorthy, E. Bianda, R. Minamisawa, L. Kranz, M. Bellini, U. Vemulapati, H. Bartolf, S. Kicin, S. Skibin, C. Papadopoulos, Munaf T. A. Rahimo
{"title":"Robust 3.3kV silicon carbide MOSFETs with surge and short circuit capability","authors":"L. Knoll, A. Mihaila, F. Bauer, V. Sundaramoorthy, E. Bianda, R. Minamisawa, L. Kranz, M. Bellini, U. Vemulapati, H. Bartolf, S. Kicin, S. Skibin, C. Papadopoulos, Munaf T. A. Rahimo","doi":"10.23919/ISPSD.2017.7988905","DOIUrl":null,"url":null,"abstract":"An approach to implement electrically robust MOSFETs in a functioning half-bridge will be investigated. For the first time, reverse conducting 3.3kV SiC MOSFETs have been fabricated with dilferent cell pitches from 14μm (p1.0) to 26μm (pl.8) that are able to withstand short circuit pulse of up to 10μs and a 9ms surge current event up to 15x the nominal current. LinPak half-bridge modules have been fabricated showing reduction of the switching loss by more than 90% compared to a silicon IGBT/diode half bridge.","PeriodicalId":202561,"journal":{"name":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISPSD.2017.7988905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

Abstract

An approach to implement electrically robust MOSFETs in a functioning half-bridge will be investigated. For the first time, reverse conducting 3.3kV SiC MOSFETs have been fabricated with dilferent cell pitches from 14μm (p1.0) to 26μm (pl.8) that are able to withstand short circuit pulse of up to 10μs and a 9ms surge current event up to 15x the nominal current. LinPak half-bridge modules have been fabricated showing reduction of the switching loss by more than 90% compared to a silicon IGBT/diode half bridge.
具有浪涌和短路能力的3.3kV碳化硅mosfet
我们将研究在半桥电路中实现电稳健性mosfet的方法。研究人员首次制造出具有14μm (p1.0)到26μm (pl.8)不同间距的3.3kV SiC mosfet,能够承受高达10μs的短路脉冲和高达15倍标称电流的9ms浪涌电流事件。LinPak半桥模块已经制造出来,与硅IGBT/二极管半桥相比,开关损耗降低了90%以上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信