Conducted EMI Analysis and Modeling for the Main Circuit of a MMC Submodule

Abstract

Electromagnetic interference (EMI) has been a nonignorable problem in modular multilevel converter(MMC) systems. Especially inside the submodules, severe EMI excited by the main circuit can be easily coupled to auxiliary circuits and affects their normal operation. In this paper, the conducted EMI of a MMC submodule is studied and modeled using time-domain simulation, based on interference source modeling and distributed parameter extraction. Then no-load test and double-pulse test are applied to verify the proposed model.