{"title":"AC poling of solution cast films of polyvinylidene fluoride/lead zirconate composites","authors":"D. Sinham, P. Pillai","doi":"10.1109/ISE.1988.38616","DOIUrl":null,"url":null,"abstract":"Summary form only given, as follows. Composite samples were prepared in the form of thin films (50-80 mu m) by solution casting techniques for different weight fractions of PZT (lead zirconate titanate) in a PVDF (polyvinylidine fluoride) matrix. Samples were AC poled at a temperature of approximately 180 degrees C. The AC poling at elevated temperatures considerably enhances the dielectric constant and is found to be a more efficient way of poling composite films than conventional DC poling. Scanning electron microscopy (SEM) and X-ray diffraction studies were done to correlate the increment in dielectric constant with structural modification.<<ETX>>","PeriodicalId":199976,"journal":{"name":"6th International Symposium on Electrets,(ISE 6) Proceedings.","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th International Symposium on Electrets,(ISE 6) Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISE.1988.38616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Summary form only given, as follows. Composite samples were prepared in the form of thin films (50-80 mu m) by solution casting techniques for different weight fractions of PZT (lead zirconate titanate) in a PVDF (polyvinylidine fluoride) matrix. Samples were AC poled at a temperature of approximately 180 degrees C. The AC poling at elevated temperatures considerably enhances the dielectric constant and is found to be a more efficient way of poling composite films than conventional DC poling. Scanning electron microscopy (SEM) and X-ray diffraction studies were done to correlate the increment in dielectric constant with structural modification.<>