A visual approach for scan path comparison

Abstract

Several algorithms, approaches, and implementations have been developed to support comparison of scan paths and finding of interesting scan path structures. In this work we contribute a visual approach to support scan path comparison. A key feature of this approach is the combination of a clustering algorithm using Levenshtein distance with the parallel scan path visualization technique. The combination of computational methods with an interactive visualization allows us to use both the power of pattern finding algorithms and the human ability to visually recognize patterns. To use the concept in practice we implemented the approach in a prototype and show its application in two scan path analysis scenarios from automobile usability testing and visualization research.