Monitoring of overmodulation effect in high efficient generally slanted transmission gratings produced in photopolymers

P. Vojtíšek, M. Květoň, I. Richter
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引用次数: 2

Abstract

In our laboratory, we use for fabrication of volume phase diffraction gratings a photopolymer recording material Bayfol HX. It is an extremely effective recording material; a high value of the refractive index modulation is obtained already during a holographic exposure. The value of this refractive index modulation influences the diffraction properties (e.g. efficiency) of the recorded gratings and, in the case of transmission gratings, the growth of this modulation beyond the optimal value leads to an effect of so called overmodulation. This effect is, in the most cases, unwanted as it causes the decrease of the diffraction efficiency from its maximum value (practically close to 100%). The analysis whether the grating is over- or under- modulated is relatively difficult as the value of the refractive index modulation can’t be measured directly and it is evaluated from the measurement of the diffraction efficiency. However, the obtained value can be often incorrect due to the overmodulation effect. In this contribution, we would like to extend (to include any arbitrary slanted transmission gratings) and discuss a simple measurement method for the determination of the correct value of the refractive index modulation based on a multiple/two-wavelength measurement of a diffraction efficiency of transmission gratings. The theoretical idea of this method and also experimental results obtained on photopolymer Bayfol HX will be presented. From practical point of view, this approach help us mainly for correct adjustment of exposure parameters to reach efficient gratings.
光聚合物中高效一般斜透射光栅过调制效应的监测
在我们的实验室中,我们使用光聚合物记录材料Bayfol HX来制作体积相衍射光栅。这是一种非常有效的录音材料;在全息曝光过程中,折射率调制的高值已经得到。该折射率调制的值影响记录光栅的衍射特性(例如效率),并且在透射光栅的情况下,该调制的增长超过最佳值导致所谓的过调制效应。在大多数情况下,这种效应是不需要的,因为它会导致衍射效率从最大值(几乎接近100%)下降。由于不能直接测量光栅的折射率调制值,只能通过对衍射效率的测量来判断,因此分析光栅是过调还是欠调比较困难。然而,由于过调制效应,得到的值往往不正确。在这篇贡献中,我们想扩展(包括任何任意倾斜的透射光栅)并讨论一种简单的测量方法,用于确定基于透射光栅衍射效率的多/双波长测量的折射率调制的正确值。本文将介绍该方法的理论思想和在光聚合物Bayfol HX上得到的实验结果。从实用的角度来看,这种方法主要帮助我们正确调整曝光参数,以达到有效的光栅。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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