Comparison of Micromachined Dielectric and Metallic Waveguides for THz applications

P. Pursula, M. Cherchi, A. Lamminen, M. Kantanen, J. Saarilahti, V. Ermolov
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Abstract

The paper considers micromachined dielectric and metallic waveguides for THz applications. Analytical analysis and simulation of losses for ideal structures are provided. Effect of fabrication nonidealities, such as surface roughness is also considered. In dielectric waveguide, the dielectric losses are the main loss mechanism, and Silicon tan8 is low above 1 THz, but increases rapidly at lower frequencies. The loss in metallic waveguides increases with increasing frequency. For ideal structures, the Silicon dielectric slot waveguide shows lower loss over 1.2 THz than the metallic waveguide. The effect of rough metal surface in the metallic waveguide increases the loss, making the dielectric waveguide interesting at even lower frequencies.
太赫兹应用中微机械介质波导和金属波导的比较
本文研究了用于太赫兹应用的微机械介质和金属波导。对理想结构的损失进行了分析和仿真。还考虑了加工非理想性的影响,如表面粗糙度。在介质波导中,介质损耗是主要的损耗机制,硅tan8在1太赫兹以上较低,但在较低频率下迅速增加。金属波导的损耗随频率的增加而增加。在理想结构下,硅介质波导在1.2太赫兹范围内的损耗比金属波导低。金属波导中粗糙金属表面的影响增加了损耗,使介质波导在更低的频率下变得有趣。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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