{"title":"AlGaN multi-quantum barriers for electron blocking in group III-nitride devices","authors":"A. Muhin, M. Guttmann, T. Wernicke, M. Kneissl","doi":"10.1109/NUSOD.2018.8570261","DOIUrl":null,"url":null,"abstract":"In this paper we investigate the enhancement of electron blocking in AlGaN multi-quantum barriers (MQBs). Simulations of effective barrier height of Al0.2Ga0.8N/GaN-MQBs were performed in order to find optimal layer design. By using a strict optimization procedure the optimized MQB exhibits an increase of the effective barrier height of over 120 meV compared to a bulk electron blocking layer (EBL). This value was achieved for nearly all combinations of material parameters found in literature and for up to ±10 % layer thickness fluctuations. Based on the optimized design a sample series for experimental determination of effective barrier heights in AlGaN-MQBs is proposed.","PeriodicalId":316299,"journal":{"name":"2018 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2018.8570261","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper we investigate the enhancement of electron blocking in AlGaN multi-quantum barriers (MQBs). Simulations of effective barrier height of Al0.2Ga0.8N/GaN-MQBs were performed in order to find optimal layer design. By using a strict optimization procedure the optimized MQB exhibits an increase of the effective barrier height of over 120 meV compared to a bulk electron blocking layer (EBL). This value was achieved for nearly all combinations of material parameters found in literature and for up to ±10 % layer thickness fluctuations. Based on the optimized design a sample series for experimental determination of effective barrier heights in AlGaN-MQBs is proposed.