A. Satrapinski, M. Gotz, E. Pesel, N. Fletcher, P. Gournay, B. Rolland
{"title":"Testing the new generation of low-frequency current comparators","authors":"A. Satrapinski, M. Gotz, E. Pesel, N. Fletcher, P. Gournay, B. Rolland","doi":"10.1109/CPEM.2016.7540594","DOIUrl":null,"url":null,"abstract":"Improved magnetic materials open the perspective of operating room-temperature current comparators at lower frequency without compromising metrological accuracy. Two prototypes of low-frequency current comparator (LFCCs) have been successfully tested in precision resistance ratio measurements at drive frequencies of 0.5 Hz and 1 Hz using the BIPM's bridge setup with a recently realized frequency extension. These measurements have been performed using standard resistors of 10 kΩ, 1 kΩ and 100 Ω nominal values as well as the quantized Hall resistance (QHR) of GaAs and graphene devices.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2016.7540594","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Improved magnetic materials open the perspective of operating room-temperature current comparators at lower frequency without compromising metrological accuracy. Two prototypes of low-frequency current comparator (LFCCs) have been successfully tested in precision resistance ratio measurements at drive frequencies of 0.5 Hz and 1 Hz using the BIPM's bridge setup with a recently realized frequency extension. These measurements have been performed using standard resistors of 10 kΩ, 1 kΩ and 100 Ω nominal values as well as the quantized Hall resistance (QHR) of GaAs and graphene devices.