TDR measurement of a solder under temperature cycle test

Qi-hai Li, Wenxiao Fang, Jing Xiao, Weiming Li, W. Chen, Haimi Qiu, J. Cui, Bin Zhou
{"title":"TDR measurement of a solder under temperature cycle test","authors":"Qi-hai Li, Wenxiao Fang, Jing Xiao, Weiming Li, W. Chen, Haimi Qiu, J. Cui, Bin Zhou","doi":"10.1109/ICRMS.2016.8050115","DOIUrl":null,"url":null,"abstract":"With the decrease in the overall size and the rapid increase in the working frequencies of printed circuit boards, the reliability of solder joints, especially the high frequency signal transmission reliability has become the key factor in system reliability. In this paper, changes in RF impedance of solder joints in a temperature cycling environment was studied using time-domain reflectometry measurements. It was found that with the increase in the temperature cycle, the intermetallic compound layer gradually thickened, and even if no macro damage was found, the RF impedance increased. The transmission reliability of the high frequency signal was degraded.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRMS.2016.8050115","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

With the decrease in the overall size and the rapid increase in the working frequencies of printed circuit boards, the reliability of solder joints, especially the high frequency signal transmission reliability has become the key factor in system reliability. In this paper, changes in RF impedance of solder joints in a temperature cycling environment was studied using time-domain reflectometry measurements. It was found that with the increase in the temperature cycle, the intermetallic compound layer gradually thickened, and even if no macro damage was found, the RF impedance increased. The transmission reliability of the high frequency signal was degraded.
焊料在温度循环试验下的TDR测量
随着印刷电路板整体尺寸的减小和工作频率的迅速提高,焊点的可靠性,特别是高频信号传输的可靠性已成为影响系统可靠性的关键因素。本文采用时域反射测量法研究了温度循环环境下焊点射频阻抗的变化。研究发现,随着温度循环的增加,金属间化合物层逐渐增厚,即使没有发现宏观损伤,射频阻抗也会增加。导致高频信号传输可靠性降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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