A semi-spherical irradiance profiles meter used as a quality control device

A. Gonzalez-Roman, M. Tecpoyotl-Torres, J. Escobedo-Alatorre, S. Pal-Verma, M. Torres-Cisneros, J. Sánchez-Mondragón
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引用次数: 6

Abstract

The design of a semi-spherical irradiance profile detector (SD) is shown. With this device, we obtain the distribution of illumination due to punctual sources in the visible range. This meter can be also used as quality control device for lamps and bulbs. We are interested in the distribution of the irradiance, instead of the total irradiance over a complete region, which is the information given by spherical meters, such as the Ulbrich spheres. The obtained discrete profiles corresponds to the irradiance, as equivalent to the voltage intensity detected in semispherical detector basic sensor. These voltage values permit us to obtain the corresponding profile to each source and give as the capability to chose the better sources for specifics tasks.
半球形辐照度测量仪,用作质量控制装置
介绍了一种半球形辐照度剖面探测器的设计。利用该装置,我们获得了可见光范围内由准时光源引起的光照分布。本仪表也可用作灯具和灯泡的质量控制装置。我们感兴趣的是辐照度的分布,而不是整个区域的总辐照度,这是由球米给出的信息,比如乌尔布里希球。得到的离散剖面对应于辐照度,相当于半球形探测器基本传感器检测到的电压强度。这些电压值使我们能够获得每个源的相应轮廓,并使我们能够为特定任务选择更好的源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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