H. Fujii, S. Tokumitsu, T. Mori, T. Yamashita, T. Maruyama, T. Maruyama, Y. Maruyama, Shigeki Nishimoto, Hiroyuki Arie, Shunji Kubo, T. Ipposhi
{"title":"A 90nm bulk BiCDMOS platform technology with 15–80V LD-MOSFETs for automotive applications","authors":"H. Fujii, S. Tokumitsu, T. Mori, T. Yamashita, T. Maruyama, T. Maruyama, Y. Maruyama, Shigeki Nishimoto, Hiroyuki Arie, Shunji Kubo, T. Ipposhi","doi":"10.23919/ISPSD.2017.7988896","DOIUrl":null,"url":null,"abstract":"This paper proposes a 90nm bulk BiCDMOS platform for automotive applications. In this platform, two types of characteristic deep trench isolations are introduced. One has a top-to-bottom air-gap which serves as a stable isolator against high voltage. Another has a tungsten plug which not only minimizes area and resistance for substrate grounding but also slims down a noise-blocking active barrier guard-ring. For an Neh LD-MOSFET, a resurf-enforcing p-type region is inserted to cancel the electric field intensification brought by little thermal treatment. The advanced 90nm rule is mainly applied to a logic area for chip-size reduction. This platform also provides analog-friendly devices such as HV BJTs, full-isolation diode and eFlash.","PeriodicalId":202561,"journal":{"name":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","volume":"1799 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISPSD.2017.7988896","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
This paper proposes a 90nm bulk BiCDMOS platform for automotive applications. In this platform, two types of characteristic deep trench isolations are introduced. One has a top-to-bottom air-gap which serves as a stable isolator against high voltage. Another has a tungsten plug which not only minimizes area and resistance for substrate grounding but also slims down a noise-blocking active barrier guard-ring. For an Neh LD-MOSFET, a resurf-enforcing p-type region is inserted to cancel the electric field intensification brought by little thermal treatment. The advanced 90nm rule is mainly applied to a logic area for chip-size reduction. This platform also provides analog-friendly devices such as HV BJTs, full-isolation diode and eFlash.