Coupling of through-hole signal via to power/ground resonance and excitation of edge radiation in multi-layer PCB

J. Pak, Jingook Kim, Jung-gun Byun, Heejae Lee, Joungho Kim
{"title":"Coupling of through-hole signal via to power/ground resonance and excitation of edge radiation in multi-layer PCB","authors":"J. Pak, Jingook Kim, Jung-gun Byun, Heejae Lee, Joungho Kim","doi":"10.1109/ISEMC.2003.1236597","DOIUrl":null,"url":null,"abstract":"This paper describes the edge radiation of signal power at multi-layer PCB mostly depends on coupling of through-hole signal via to power/ground plane, and the coupling mechanism is the loading effects of power/ground plane impedance on signal return current. It is well known that the variation of power/ground impedance comes from power/ground resonance, and the variation range is up to several tens ohm (/spl Omega/). In 50/spl Omega/ system, this range impedance makes signal input matching worse. Moreover, the transmitted signal is divided into two parts, load and power/ground plane. Finally, the assimilated signal power by power/ground plane is emitted from PCB open edge, which is a good radiation structure. Above analysis is shown in this paper by Spice modeling of through-hole signal via and power/ground plane and measuring the near field strength at PCB edge with/without through-hole signal via cases. The loading effects are seen in S-parameters and input impedance of signal traces and PCB edge radiation in |S21| between signal trace and near field probe. The trace with through-hole signal via case has the larger radiated emission at PCB edge than without case by more than 20dB.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

Abstract

This paper describes the edge radiation of signal power at multi-layer PCB mostly depends on coupling of through-hole signal via to power/ground plane, and the coupling mechanism is the loading effects of power/ground plane impedance on signal return current. It is well known that the variation of power/ground impedance comes from power/ground resonance, and the variation range is up to several tens ohm (/spl Omega/). In 50/spl Omega/ system, this range impedance makes signal input matching worse. Moreover, the transmitted signal is divided into two parts, load and power/ground plane. Finally, the assimilated signal power by power/ground plane is emitted from PCB open edge, which is a good radiation structure. Above analysis is shown in this paper by Spice modeling of through-hole signal via and power/ground plane and measuring the near field strength at PCB edge with/without through-hole signal via cases. The loading effects are seen in S-parameters and input impedance of signal traces and PCB edge radiation in |S21| between signal trace and near field probe. The trace with through-hole signal via case has the larger radiated emission at PCB edge than without case by more than 20dB.
多层PCB中通孔信号经电源/地谐振耦合及边缘辐射激励
多层PCB板上信号功率的边缘辐射主要取决于通孔信号经孔到电源/地平面的耦合,耦合机理是电源/地平面阻抗对信号返回电流的加载效应。众所周知,功率/地阻抗的变化来源于功率/地谐振,其变化范围可达几十欧姆(/spl ω /)。在50/spl ω /系统中,此范围阻抗使信号输入匹配变差。传输信号分为负载和电源/地两部分。最后将经电源/地平面吸收的信号功率从PCB开边发射出去,是一种良好的辐射结构。本文通过Spice模型对通孔信号通孔和功率/地平面进行建模,并在有/没有通孔信号通孔的情况下测量PCB边缘的近场强度。加载效应体现在信号走线与近场探头之间的s参数、输入阻抗和PCB边缘辐射。带通孔信号通孔的走线在PCB边缘的辐射发射比不带通孔的走线高20dB以上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信