Carbon Nanotubes As Scanning Probe Tips

Abstract

We have constructed a device for manipulating carbon nanotubes inside a transmission electron microscope. This setup allows us to select an individual nanotube of our choice and to attach it to an AFM probe tip. This way we obtain a tool which is useful for diverse applications. It can be used as a “classical AFM probe” yet with enhanced resolution due to the small size of the nanotube ending and mechanical properties of carbon nanotubes. Employing a conductive layer as “glue” between the nanotube and the probe enables us to make transport measurements on a single nanotube. Biasing the nanotube, electron and light emission occurs at the tip of the nanotube. This light emission is the basis of constructing a Scanning Near‐field Optical Microscope (SNOM) with carbon nanotubes.