Estimation of energy penetration through the electronics housing under external microwave radiation in the resonance mode of shielding

Abstract

In this paper the estimation of the energy stored inside the electronics shield under microwave exposure that can damage its components in the worst case of shielding effectiveness resonance decreasing is under investigation. The shielding box acting as electromagnetic resonator concept excited by exterior microwaves through the narrow slit was stated. The numerical expressions of both voltage drop in the slit and energy accumulated in the cylindrical enclosure that in first approximation modeled the real electronics housing are obtained. Test calculation shows the stored energy can exceed of several micro joules that tend to reach the degradation level of the typical electronic components and devices susceptible to microwave irradiation.