Characterization methods for the sensitivity of quartz oscillators to the environment

Abstract

The distinction is shown between characterizing a complete oscillator, and characterizing only the quartz resonator by using a passive phase bridge. Advantages and disadvantages of the two approaches are discussed. Then measurements of temperature sensitivities, including quasistatic or dynamic thermal conditions are presented. One important points how to measure the real temperature of the device under test (quartz crystal for instance) rather than the temperature of the probe. Methods for measuring acceleration and pressure sensitivities are presented taking spurious effects of temperature changes into consideration. Various problems are discussed in connection with the measurement of the sensitivity to magnetic fields and electric fields.<>