{"title":"Examination of Electric Fields in Ferroelectrics by Impact Ionization","authors":"T. A. Rost, T. Rabson","doi":"10.1364/pmed.1990.bp4","DOIUrl":null,"url":null,"abstract":"The space charge fields present in ferroelectric thin films are examined with impact ionization. The possibility of using this technique as a probe to aid in the understanding of the bulk photovoltaic effect is discussed.","PeriodicalId":385625,"journal":{"name":"Topical Meeting on Photorefractive Materials, Effects, and Devices II","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Photorefractive Materials, Effects, and Devices II","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/pmed.1990.bp4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The space charge fields present in ferroelectric thin films are examined with impact ionization. The possibility of using this technique as a probe to aid in the understanding of the bulk photovoltaic effect is discussed.