E. Sharifi, S. Jayaram, E. Cherney, S. Haq, R. Omranipour
{"title":"IEC qualification test applied to capacitively graded 13.8 kV bar samples energized with repetitive fast pulses","authors":"E. Sharifi, S. Jayaram, E. Cherney, S. Haq, R. Omranipour","doi":"10.1109/EIC.2011.5996187","DOIUrl":null,"url":null,"abstract":"The paper investigates the repetitive fast pulse tests using IEC-TS 60034–18–42 as applied to 13.8 kV bar samples with two different stress grading systems: nonlinear resistive and capacitive. Insulated copper bars were furnished with a capacitive stress grading system consisting of aluminum foils embedded into the groundwall insulation forming a capacitively graded system. The effectiveness of the capacitive stress grading is shown by passing all of the IEC/TS 60034–18–42 qualification tests showing considerably lower temperature rise than resistive stress grading systems.","PeriodicalId":129127,"journal":{"name":"2011 Electrical Insulation Conference (EIC).","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Electrical Insulation Conference (EIC).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIC.2011.5996187","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
The paper investigates the repetitive fast pulse tests using IEC-TS 60034–18–42 as applied to 13.8 kV bar samples with two different stress grading systems: nonlinear resistive and capacitive. Insulated copper bars were furnished with a capacitive stress grading system consisting of aluminum foils embedded into the groundwall insulation forming a capacitively graded system. The effectiveness of the capacitive stress grading is shown by passing all of the IEC/TS 60034–18–42 qualification tests showing considerably lower temperature rise than resistive stress grading systems.