{"title":"The Hidden Challenges in Manufacturing Variations","authors":"S. Sayfan-Altman, R. Bloch, A. Manukovsky","doi":"10.1109/COMCAS52219.2021.9628997","DOIUrl":null,"url":null,"abstract":"In this work we will examine the manufacturing variation effect and design robustness in the context of complex PCB structures’ performance for high-speed links. A case study of robust design implementation for a differential capacitor structure is examined. The main design parameters variation is identified and key contributors to performance degradation are outlined. Then a method of maximizing design robustness is presented and a commonly used design is altered to maximize immunity to manufacturing variation. The proposed structure robustness is analyzed, and superior impedance control under various scenarios of expected manufacturing variation is demonstrated.","PeriodicalId":354885,"journal":{"name":"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMCAS52219.2021.9628997","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this work we will examine the manufacturing variation effect and design robustness in the context of complex PCB structures’ performance for high-speed links. A case study of robust design implementation for a differential capacitor structure is examined. The main design parameters variation is identified and key contributors to performance degradation are outlined. Then a method of maximizing design robustness is presented and a commonly used design is altered to maximize immunity to manufacturing variation. The proposed structure robustness is analyzed, and superior impedance control under various scenarios of expected manufacturing variation is demonstrated.