Dependence of space-charge trapping threshold on temperature in polymeric DC cables

G. Montanari, Giovanni Mazzanti, F. Palmieri, G. Perego, S. Serra
{"title":"Dependence of space-charge trapping threshold on temperature in polymeric DC cables","authors":"G. Montanari, Giovanni Mazzanti, F. Palmieri, G. Perego, S. Serra","doi":"10.1109/ICSD.2001.955518","DOIUrl":null,"url":null,"abstract":"This paper shows that the charge detrapping rate follows an Arrhenius-type law when the poling electrical field is large enough to cause copious injection of electrons, so that the transport and trapping process is dominated by electronic carriers. At fields close to the charge accumulation threshold, the tested materials, LDPE and XLPE, suggest that the conduction mechanism takes into account both ionic and electronic charge carriers. The threshold field for space charge accumulation significantly decreases as the temperature increases, at least in the range 20 to 60 /spl deg/C, even if it seems that the temperature dependence becomes smoother above 50 to 60 /spl deg/C. The increase of mobility with temperature and, thus, of charge depletion rate, after each polarisation voltage reversal, also follows an Arrhenius-type law, with smaller activation energy values for XLPE. These results must be considered when designing dc polymeric insulation systems, such as HVDC cables, since charge accumulation is a degradation acceleration factor and the temperature distribution in the cable can change significantly with loading conditions.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.2001.955518","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

This paper shows that the charge detrapping rate follows an Arrhenius-type law when the poling electrical field is large enough to cause copious injection of electrons, so that the transport and trapping process is dominated by electronic carriers. At fields close to the charge accumulation threshold, the tested materials, LDPE and XLPE, suggest that the conduction mechanism takes into account both ionic and electronic charge carriers. The threshold field for space charge accumulation significantly decreases as the temperature increases, at least in the range 20 to 60 /spl deg/C, even if it seems that the temperature dependence becomes smoother above 50 to 60 /spl deg/C. The increase of mobility with temperature and, thus, of charge depletion rate, after each polarisation voltage reversal, also follows an Arrhenius-type law, with smaller activation energy values for XLPE. These results must be considered when designing dc polymeric insulation systems, such as HVDC cables, since charge accumulation is a degradation acceleration factor and the temperature distribution in the cable can change significantly with loading conditions.
聚合物直流电缆中空间电荷捕获阈值与温度的关系
本文表明,当极化电场足够大,导致大量电子注入时,电荷脱陷速率遵循Arrhenius-type定律,使得输运和捕获过程由电子载流子主导。在接近电荷积累阈值的电场下,测试材料LDPE和XLPE表明,导电机制同时考虑了离子和电子载流子。随着温度的升高,空间电荷积累的阈值场显著减小,至少在20 ~ 60 /spl°C范围内,即使温度依赖性在50 ~ 60 /spl°C以上似乎变得更平滑。在每次极化电压反转后,迁移率随温度的增加以及电荷耗尽率的增加也遵循arrhenius型定律,XLPE的活化能值较小。在设计直流聚合物绝缘系统(如高压直流电缆)时必须考虑这些结果,因为电荷积累是一个退化加速因素,电缆中的温度分布会随着负载条件发生显著变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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