{"title":"Reliability analysis via numerical simulation of power electronic circuits","authors":"L. Kamas, S. Sanders","doi":"10.1109/CIPE.1994.396720","DOIUrl":null,"url":null,"abstract":"This paper gives conceptual background on reliability analysis in the presence of circuit parameter variation. A method for reliability analysis, the first-order reliability method (FORM), is described in detail and demonstrated on circuit examples. Simulation results are then compared to a Monte Carlo analysis.<<ETX>>","PeriodicalId":123138,"journal":{"name":"Proceedings of 1994 IEEE Workshop on Computers in Power Electronics","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE Workshop on Computers in Power Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIPE.1994.396720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This paper gives conceptual background on reliability analysis in the presence of circuit parameter variation. A method for reliability analysis, the first-order reliability method (FORM), is described in detail and demonstrated on circuit examples. Simulation results are then compared to a Monte Carlo analysis.<>