{"title":"Sketched symbol recognition using Zernike moments","authors":"H. Hse, A. Newton","doi":"10.1109/ICPR.2004.1334128","DOIUrl":null,"url":null,"abstract":"We present an on-line recognition method for hand-sketched symbols. The method is independent of stroke-order, -number, and -direction, as well as invariant to scaling, translation, rotation and reflection of symbols. Zernike moment descriptors are used to represent symbols and three different classification techniques are compared: support vector machines (SVM), minimum mean distance (MMD), and nearest neighbor (NN). We have obtained a 97% recognition accuracy rate on a dataset consisting of 7,410 sketched symbols using Zernike moment features and a SVM classifier.","PeriodicalId":335842,"journal":{"name":"Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"160","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPR.2004.1334128","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 160
Abstract
We present an on-line recognition method for hand-sketched symbols. The method is independent of stroke-order, -number, and -direction, as well as invariant to scaling, translation, rotation and reflection of symbols. Zernike moment descriptors are used to represent symbols and three different classification techniques are compared: support vector machines (SVM), minimum mean distance (MMD), and nearest neighbor (NN). We have obtained a 97% recognition accuracy rate on a dataset consisting of 7,410 sketched symbols using Zernike moment features and a SVM classifier.