An adaptive device impedance matching circuit

Abstract

Test engineers have been frustrated in their efforts to perform accurate functional testing of high speed VLSI devices on commercial ATE because of the impedance mismatch between the device and the ATE pin electronics. This mismatch between the low device output impedance and high ATE test station impedance causes signal reflections ('ringing') that interfere with testing. This paper will describe a circuit that effectively eliminates the problem of signal reflections. In contrast to earlier proposed solutions, this circuit is simple to understand and use.<>