S. B. Pati, S. K. Barik, Subhasri Kundu, Ritesh Dash, Adithya Ballajhi
{"title":"DC-Microgrid Fault Detection & Classification Using ANN Enabled BAT Algorithm","authors":"S. B. Pati, S. K. Barik, Subhasri Kundu, Ritesh Dash, Adithya Ballajhi","doi":"10.1109/TEECCON54414.2022.9854825","DOIUrl":null,"url":null,"abstract":"Power electronic best components are most sensitive to variation in voltage and current. therefore these components when connected to a DC microgrid needs more attention and protection against a different type of circuit faults like short circuit and open circuit condition. During short circuit condition the flow of heavy current will damage the electronic devices and thereby in order to achieve the protection these electronic devices may trip themselves. sudden tripping of the devices will have an adverse negative impact on the DC microgrid. This paper presents a new ANN-enabled bat algorithm to detect the DC fault and to isolate the fault from the rest part of the system. Matlab simulink based model has been developed to test the prototype and to compare the ANN enabled bat algorithm with other algorithm for comparing the efficiency of the proposed algorithm.","PeriodicalId":251455,"journal":{"name":"2022 Trends in Electrical, Electronics, Computer Engineering Conference (TEECCON)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Trends in Electrical, Electronics, Computer Engineering Conference (TEECCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEECCON54414.2022.9854825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Power electronic best components are most sensitive to variation in voltage and current. therefore these components when connected to a DC microgrid needs more attention and protection against a different type of circuit faults like short circuit and open circuit condition. During short circuit condition the flow of heavy current will damage the electronic devices and thereby in order to achieve the protection these electronic devices may trip themselves. sudden tripping of the devices will have an adverse negative impact on the DC microgrid. This paper presents a new ANN-enabled bat algorithm to detect the DC fault and to isolate the fault from the rest part of the system. Matlab simulink based model has been developed to test the prototype and to compare the ANN enabled bat algorithm with other algorithm for comparing the efficiency of the proposed algorithm.