Storage reliability

J. Rooney
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引用次数: 15

Abstract

Reviews the methods and models of US Air Force publication RADC-TR-85-91 (Impact of nonoperating periods on equipment reliability). Example calculations are presented, and statistical techniques are used to compare the data from the literature with the RADC-calculated storage failure rates for simple components, systems, and an exotic component. Areas for improvement are noted, including the refinement of the environmental factors, addition to methods to deal with surface-mount components, and (for completeness) a section on nonelectronic components. It is noted that components with a known shelf life should be clearly identified, so that analysts do not attempt to predict a storage failure rate beyond the end of life for those components.<>
存储的可靠性
回顾了美国空军出版物RADC-TR-85-91(非运行期对设备可靠性的影响)的方法和模型。给出了示例计算,并使用统计技术将文献中的数据与radc计算的简单组件、系统和外来组件的存储故障率进行比较。需要改进的地方被注意到,包括环境因素的细化,除了处理表面贴装元件的方法,以及(为了完整性)关于非电子元件的部分。需要注意的是,应该清楚地标识已知保质期的组件,以便分析人员不会试图预测超过这些组件寿命结束的存储故障率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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