{"title":"Theoretical and experimental thermal resistance of VCSELs considering thermal conductivity reduction effect of thin layer","authors":"M. Mimura, T. Miyamoto","doi":"10.23919/MOC.2017.8244530","DOIUrl":null,"url":null,"abstract":"Reduction of thermal conductivity in a thin layer structure has been known, however the influence to the device has not been discussed clearly. This study analysed thermal resistance of VCSEL numerically and compared with experimentally fabricated device. The effect is significant influence which can not be ignored in device design.","PeriodicalId":123743,"journal":{"name":"2017 22nd Microoptics Conference (MOC)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 22nd Microoptics Conference (MOC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MOC.2017.8244530","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Reduction of thermal conductivity in a thin layer structure has been known, however the influence to the device has not been discussed clearly. This study analysed thermal resistance of VCSEL numerically and compared with experimentally fabricated device. The effect is significant influence which can not be ignored in device design.